GE Inspection Phasor XS Phased Array Ultrasonic Flaw Detector NDT

Sell used GE Inspection Phasor XS Phased Array Ultrasonic Flaw Detector. Used in very good and fully working condition.

Condition: Used

Up for sale GE Inspection Phasor XS Phased Array Ultrasonic Flaw Detector. Used in very good and fully working condition.

Pakcages includes:

  • GE Inspection Phasor XS unit
  • Transdusers 2.0MHz (115-500-012)
  • Transdusers 4.0MHz (115-500-013)
  • Wedge
  • Battery pack
  • AC adapter/charger
  • User Manual on CD-ROM
  • Carrying Case

The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a code-compliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.

When used in Phased Array mode, the operator can electronically control multiple beams from one probe. The precise beam control
including angle, focus and size, results in improved probability of detection (POD) and sizing. With one scan from one contact
location, greater area is covered and comprehensive data can be viewed in real time on a full color sector display. When compared to conventional Ultrasonic inspection, the productivity and cost savings from the Phasor XS are easily measured.

Productivity gains
When the inspection requires a different angle with conventional ultrasonic testing, the operator must change his probe and re-visualize the integration of the new information. A different time base and sensitivity level is represented. Although this is not a problem for the skilled operator, it takes time. Through the power of Phasor XS, these inefficiencies are drastically minimized.

Real time color imaging from the Phasor XS supplies an integrated cross-sectional visualization of the part originating from multiple angles. A single A-Scan can also be selected for display in combination with the image. With a single probe, you can achieve more than ever before – and in less time.

Overall, the Phasor XS provides:

  • Improved area coverage, faster results
  • More information from one scan of the part
  • Better recorded result from the generation of an image
  • One probe replicates the capabilities of many conventional UT probes and wedges
  • Time and cost savings from reduced hours evaluating indications with multiple angles

Measurable time savings
Some weld inspections require a complete scan with three separate angles. Using the Phasor XS can result in a time savings of two thirds.

Test quality improvements
Defect orientation is a prediction made in the development of a test procedure and an inspection angle is chosen based on this prediction. Beam spread is chosen purposely broad to account for some level of error in the prediction, so essentially it is a compromise.

With the Phasor XS, electronic control of the beam allows test procedures to be developed that will yield higher Probability of Detection (POD), in the same inspection time, by allowing the choice of an ideal beam over the full inspection area. The quality of the scan is improved and the Phasor XS’ full-color, real time sector display with selectable A-Scan supplies the standard accepted method for instant and reliable sizing.

Simple change over
Building Phased Array capabilities into a successful proven operating platform ensures the transition to Phased Array inspection will be cost effective. Phasor XS’ simple menu driven operation of basic Phased Array controls puts the technology within reach of the Level II field inspector. Data is easily interpreted and the cost of training is minimal.

Standard Features
An on board data set memory is combined with removable storage via an SD card for documentation and setup storage. This ensures your operators will be working with consistent setups to get brilliant results that you can see later on the screen or computer.

The unique Sector Freeze mode allows review and storage of all the A-Scans behind the image. Select your beam of interest from all of the shots for separate display and improve your sizing with focal and angle control.

  • Combined Phased Array and code compliant Conventional UT flaw detector
  • Truly portable Phased Array – less than 4 kg (7 lbs)
  • Electronically controlled and selectable beam angles, focus and size
  • Simultaneous inspection with multiple beams from a single location
  • Full color, real time sector display with a selectable ASCAN
  • Fullscreen Bscan plus Display reverse and flip
  • Rugged packaging to withstand heavy onsite use
  • Snap shot image storage of sector images and ASCANS
  • ialog probes 16/64
  • Delay law calculator
  • Push button control for operation in a bag
  • Simple operating scheme
  • Image transfer via SD card


GE Inspection Phasor XS Technical Specifications


Conventional Channel

Phased Array Channels

Display Size Resolution 6.5 inch VGA (640*480 pixel) color TFT, 60Hz refresh rate
Battery Type Custom Li-Ion battery pack (3S6P configuration)
Battery Life 4 hours minimum
Battery Charging External charger that connects directly to the battery pack
External Power Supply Universal input (85 – 265V / 50 – 60 Hz)
Units of Measure inch and mm
SD Card Memory Sealed compartment
Number of Cycles Focal laws 1 128 (max)
Pulse repetition Frequency 15 to 2000Hz 15 to 7680Hz
Pulser Type Spike Bipolar Squarewave
Pulser Voltage 300V (max) +/-25V to +/-75V
Pulser Energy Low, High N/A
Pulser Rise Time <15ns Not Specified
Damping 50, 500 and 1000 N/A
Dual Mode Off and On N/A
Receiver Input Capacitance <50pF  
Maximum Input Voltage 40Vp-p  
Bandwidth/ Amplifier bandpass

0.3 to 15MHz(-3dB points)

0.5 to 10MHz

Direct Documentation format


Probe Connections

00 Lemo/ BNC Adaptor Supplied

Custom Supplied

Physical Probe N/A 1 to 64
Virtual Probe N/A 1 to 16
Number of Cycles 1 1 to 128
Pulser Width (1/2 cycle) N/A 40 to 500ns
Pulser Delay N/A 0 to 10.24us
Receiver Delay N/A 0 to 10.24us
Receiver Input Resistance 1000ohm (dual mode) 220ohm
Analog Gain 0 to 110.0dB 0 to 40.0dB
Digital Gain N/A 0 to 50.0dB
Frequency Select 2.25MHz, 5MHz, LP and HP
Rectification PosHW, NegHW and Fullwave
Measurment Resolution 5nsec
Displayed Readings A%A, A%B, SA/, SA^, SB/, SB^
VGA output Yes
SD Card Memory Yes
RS 232 interface


Auto Timebase Calibration



Reject 0 to 80%
TCG 16 points (max) - 6dB/usec
Sound Velocity .0393 - .5905”/us[1000 – 15000m/s]
Range 5m @ steel shear velocity 1m @ steel shear velocity
Display Delay 2.5m @ steel shear velocity 1m @ steel shear velocity
Gates A, B A,B,IF
Gate Threshold 5% to 95%
Gate Start 0.1mm to 2m 0.1mm to 1m
Gate Width 0.1mm to 2m 0.1mm to 1m
Gate Modes

Off, Pos, Neg[Off, Coincidence, Anticoinci-dence]

TOF Modes Flank, Peak
Scan type


Linear or Sector

Data visualiztion refresh rate 60Hz
Available views


Ascan only, Image only, Ascan + Image

Dialog Languages English, Spanish, German, French, Chinese, Japanese
Dimensions (W x H x D) 11.1 x 6.75 x 6.25 inch (282 x 171 x 159 mm)
Weight 7.5lbs (with batteries)
Environmental Tests
Cold Storage

-20C for 72 hrs, 502.4 Procedure I

Cold Operation

0C for 16 hrs, 502.4 Procedure II

Heat Storage +70C for 48 hrs, 501.4 Procedure I
Heat Operation +55C for 16 hrs, 501.4 Procedure II
Damp Heat / Humidity (storage) 10 Cycles: 10hrs at +65C down to +30C, 10 hrs at +30C up to +65C, Transition within 2 hrs, 507.4
Temperature Shock 3 Cycles: 4 hrs at –20C up to +70C, 4 hrs at +70C, Transitions within 5 minutes, 503.4 Procedure II
Vibration 514.5-5 Procedure I, Annex C, Figure 6, General exposure: 1hr each axis
Shock 6 cycles each axis, 15g, 11ms half sine, 516.5 Procedure I
Loose Cargo 514.5 Procedure II
Transit Drop (packaged for shipment) 516.5 Procedure IV, 26 drops
Environmental Sealing Tests
  • IP54 / IEC529 … Dust Proof / dripping water
  • proof as per IEC 529 specifications for IP54 classification
  • Environmental
  • op temp
  • Low battery indication
  • Amlitude variation expected over battery life
  • Graticule
  • Architectural suppression
  • Linearity on timebase
  • Pulser, Voltage p to p, rise time, duration, fall time, Reverberation ampitude, frequncy spectrum plot
  • Ampifier and attenuator