GE Inspection Phasor XS Phased Array Ultrasonic Flaw Detector NDT

Up for sale GE Inspection Phasor XS Phased Array Ultrasonic Flaw Detector. Used in very good and fully working condition.

Pakcages includes:

• GE Inspection Phasor XS unit
• Transdusers 2.0MHz (115-500-012)
• Transdusers 4.0MHz (115-500-013)
• Wedge
• Battery pack
• AC adapter/charger
• User Manual on CD-ROM
• Carrying Case

The GE Phasor XS brings the proven advantages of Phased Array technology to a new – and accessible – level. This portable and rugged device combines the value of Phased Array with a code-compliant conventional UT flaw detector. It is simple to use, easy to learn and specially designed with practical, relevant features.

When used in Phased Array mode, the operator can electronically control multiple beams from one probe. The precise beam control
including angle, focus and size, results in improved probability of detection (POD) and sizing. With one scan from one contact
location, greater area is covered and comprehensive data can be viewed in real time on a full color sector display. When compared to conventional Ultrasonic inspection, the productivity and cost savings from the Phasor XS are easily measured.

Productivity gains
When the inspection requires a different angle with conventional ultrasonic testing, the operator must change his probe and re-visualize the integration of the new information. A different time base and sensitivity level is represented. Although this is not a problem for the skilled operator, it takes time. Through the power of Phasor XS, these inefficiencies are drastically minimized.

Real time color imaging from the Phasor XS supplies an integrated cross-sectional visualization of the part originating from multiple angles. A single A-Scan can also be selected for display in combination with the image. With a single probe, you can achieve more than ever before – and in less time.

Overall, the Phasor XS provides:

• Improved area coverage, faster results
• More information from one scan of the part
• Better recorded result from the generation of an image
• One probe replicates the capabilities of many conventional UT probes and wedges
• Time and cost savings from reduced hours evaluating indications with multiple angles

Measurable time savings
Some weld inspections require a complete scan with three separate angles. Using the Phasor XS can result in a time savings of two thirds.

Test quality improvements
Defect orientation is a prediction made in the development of a test procedure and an inspection angle is chosen based on this prediction. Beam spread is chosen purposely broad to account for some level of error in the prediction, so essentially it is a compromise.

With the Phasor XS, electronic control of the beam allows test procedures to be developed that will yield higher Probability of Detection (POD), in the same inspection time, by allowing the choice of an ideal beam over the full inspection area. The quality of the scan is improved and the Phasor XS’ full-color, real time sector display with selectable A-Scan supplies the standard accepted method for instant and reliable sizing.

Simple change over
Building Phased Array capabilities into a successful proven operating platform ensures the transition to Phased Array inspection will be cost effective. Phasor XS’ simple menu driven operation of basic Phased Array controls puts the technology within reach of the Level II field inspector. Data is easily interpreted and the cost of training is minimal.

Standard Features
An on board data set memory is combined with removable storage via an SD card for documentation and setup storage. This ensures your operators will be working with consistent setups to get brilliant results that you can see later on the screen or computer.

The unique Sector Freeze mode allows review and storage of all the A-Scans behind the image. Select your beam of interest from all of the shots for separate display and improve your sizing with focal and angle control.

• Combined Phased Array and code compliant Conventional UT flaw detector
• Truly portable Phased Array – less than 4 kg (7 lbs)
• Electronically controlled and selectable beam angles, focus and size
• Simultaneous inspection with multiple beams from a single location
• Full color, real time sector display with a selectable ASCAN
• Fullscreen Bscan plus Display reverse and flip
• Rugged packaging to withstand heavy onsite use
• Snap shot image storage of sector images and ASCANS
• ialog probes 16/64
• Delay law calculator
• Push button control for operation in a bag
• Simple operating scheme
• Image transfer via SD card

GE Inspection Phasor XS Technical Specifications